Scanning-electron-microscope
noun
1.
a device in which the specimen is examined point by point directly in a moving electron beam, and electrons reflected by the specimen are used to form a magnified, three-dimensional image on a television screen.
Abbreviation: SEM.
scanning electron microscope
noun
1.
a type of electron microscope that produces a three-dimensional image
scanning electron microscope n.
Abbr. SEM
An electron microscope that forms a three-dimensional image on a cathode-ray tube by moving a beam of focused electrons across an object and reading both the electrons scattered by the object and the secondary electrons produced by it.
scanning electron microscope
(skān’ĭng)
An electron microscope that moves a narrowly focused beam of electrons across an object and detects the patterns made by the electrons scattered by the object and the electrons knocked loose from the object. From these patterns a three-dimensional image of the object is created.
Read Also:
- Scanning force microscope
scanning force microscope See atomic force microscope.
- Scanning-line
noun 1. (in a cathode-ray or television tube) a single horizontal trace made by the electron beam in one traversal of the fluorescent screen. Compare frame (def 9).
- Scanning probe microscope
scanning probe microscope definition Any of a number of devices capable of producing images of individual atoms and molecules on surfaces of materials. (See also nanotechnology.)
- Scanning-tunneling-microscope
noun 1. a device that uses a moving needle and the tunnel effect to generate a maplike image of the atomic surface structure of matter, thereby achieving even greater magnification than the scanning electron microscope. scanning tunneling microscope A microscope used to make images of individual atoms on the surface of a metal. The microscope […]
- Scanno
/skan’oh/ An error in a document caused by a scanner glitch, analogous to a typo or thinko. [Jargon File] (1995-02-14)